Concept information
Preferred term
Atomic force microscopy
Type
-
Topic
Broader concept
Entry terms
- AFM
- Scanning force microscopy
Identifier
- HUME66500
In other languages
-
Norwegian Bokmål
-
AFM
-
Atomkraftmikroskopi
-
Atomærkraftmikroskopi
-
Rasterkraftmikroskopi
-
SFM
-
Sveipkraftmikroskopi
URI
http://data.ub.uio.no/humord/c66500
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