Skip to main content

Humord

Search from vocabulary

Content language

Concept information

General > Microscopy > Scanning microscopy > Atomic force microscopy

Preferred term

Atomic force microscopy  

Type

  • Topic

Broader concept

Entry terms

  • AFM
  • Scanning force microscopy

Identifier

  • HUME66500

In other languages

  • Atomkraftmikroskopi

    Norwegian Bokmål

  • AFM
  • Atomkraftmikroskopi
  • Atomærkraftmikroskopi
  • Rasterkraftmikroskopi
  • SFM
  • Sveipkraftmikroskopi
  • AFM

    Norwegian Nynorsk

  • Atomkraftmikroskopi
  • Atomærkraftmikroskopi
  • Rasterkraftmikroskopi
  • SFM
  • Sveipkraftmikroskopi

URI

http://data.ub.uio.no/humord/c66500

Download this concept:

RDF/XML TURTLE JSON-LD Created 5/23/24, last modified 6/5/24