Humord
type: ConceptScheme

Microscopy
type: Topic
type: Concept
narrower: Scanning microscopy
preferred label: Mikroskopi @nn

Scanning microscopy
type: Concept
type: Topic
created: 2024-05-23T00:00:00
modified: 2024-05-23T11:27:39
alternative label: Scanning probe microscopy
alternative label: Scanning mikroskopering @nn
alternative label: Rastermikroskopi @nn
broader: Microscopy
editorial note: Lukket bemerkning: ubo24 @nb
in scheme: Humord
narrower: Atomic force microscopy
narrower: Scanning electron microscopy
narrower: Low-voltage scanning electron microscopy
preferred label: Sveipmikroskopi @nn

Atomic force microscopy
type: Topic
type: Concept
broader: Scanning microscopy
preferred label: Atomkraftmikroskopi @nn

Low-voltage scanning electron microscopy
type: Topic
type: Concept
broader: Scanning microscopy
preferred label: LVSEM @nn

Scanning electron microscopy
type: Topic
type: Concept
broader: Scanning microscopy
preferred label: Sveipelektronmikroskopi @nn

Topic
type: Class
label: Innholdsbeskrivende emne @nb