@prefix rdfs: <http://www.w3.org/2000/01/rdf-schema#> .
@prefix owl: <http://www.w3.org/2002/07/owl#> .
@prefix humord: <http://data.ub.uio.no/humord/> .
@prefix skos: <http://www.w3.org/2004/02/skos/core#> .
@prefix dc: <http://purl.org/dc/terms/> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .

<http://data.ub.uio.no/onto#Topic>
  a rdfs:Class, owl:Class ;
  rdfs:label "Innholdsbeskrivende emne"@nb, "Topic"@en .

humord:c67449
  a skos:Concept, <http://data.ub.uio.no/onto#Topic> ;
  dc:created "2024-07-04T00:00:00"^^xsd:dateTime ;
  dc:identifier "HUME67449" ;
  dc:modified "2024-07-17T09:02:45"^^xsd:dateTime ;
  skos:altLabel "Drive-level capacitance profiling"@en, "Impedance spectroscopy"@en, "Capacitance-voltage profiling"@en, "Admittance spectroscopy"@en, "Depletion capacitance spectroscopy"@en, "Impedansspektroskop"@nn, "Impedansspektrosko"@nb, "Deep-level transient spectroscopy"@en ;
  skos:broader humord:c28710 ;
  skos:definition "Kapasitansspektroskopi er ulike teknikker for å karakterisere elektriske egenskaper til halvledermaterialer. <Capacitance Spectroscopy of Semiconductors (CRC Press 2018)>"@nb ;
  skos:editorialNote "Lukket bemerkning: ubo24"@nb ;
  skos:inScheme humord: ;
  skos:prefLabel "Kapasitansspektroskopi"@nn, "Kapasitansspektroskopi"@nb, "Capacitance spectroscopy"@en .

humord:
  a skos:ConceptScheme ;
  rdfs:label "Humord"@nb .

humord:c28710
  a <http://data.ub.uio.no/onto#Topic>, skos:Concept ;
  skos:narrower humord:c67449 ;
  skos:prefLabel "Spektroskopi"@nn, "Spectroscopy"@en, "Spektroskopi"@nb .