@prefix realfagstermer: <http://data.ub.uio.no/realfagstermer/> .
@prefix skos: <http://www.w3.org/2004/02/skos/core#> .
@prefix ns0: <http://data.ub.uio.no/onto#> .
@prefix dc: <http://purl.org/dc/terms/> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .
@prefix void: <http://rdfs.org/ns/void#> .
@prefix sd: <http://www.w3.org/ns/sparql-service-description#> .
@prefix rdfs: <http://www.w3.org/2000/01/rdf-schema#> .
@prefix owl: <http://www.w3.org/2002/07/owl#> .

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  dc:created "2019-09-16T00:00:00"^^xsd:dateTime ;
  dc:identifier "REAL032139" ;
  dc:modified "2019-09-16T17:20:18"^^xsd:dateTime ;
  skos:altLabel "Impedansspektroskopi"@nb, "Admittance spectroscopy"@en, "Impedance spectroscopy"@en, "Depletion capacitance spectroscopy"@en, "Capacitance-voltage profiling"@en, "Deep-level transient spectroscopy"@en, "Drive-level capacitance profiling"@en, "Impedansspektroskopi"@nn ;
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  skos:editorialNote "Ulike teknikker for å karakterisere elektriske egenskaper til halvledermaterialer. Ref: Capacitance Spectroscopy of Semiconductors (CRC Press 2018)"@nb ;
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  skos:prefLabel "Capacitance spectroscopy"@en, "Kapasitansspektroskopi"@nn, "Kapasitansspektroskopi"@nb .

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